An Investigation of Ink, Coating and Substrate Surfaces Using Atomic Force Microscopy.

One of the most widely used techniques in the analysis of complex printing problems is microscopy. The visible microscope, which is still the primary tool used, was augmented by the use of the scanning electron microscope (SEM) during the past 15 years. These are a very powerful combination for such investigations. The development of scanning probe microscopes has recently led to the commercial availability of the atomic force microscope (AFM). This instrument provides additional power and allows examination of surfaces at high magnification and resolution without the use of vacuum or conductive coating of specimens. AFM also allows imaging of the relative hardness and stickiness of the same specimen area which has been topographically mapped. Images of a variety of printed and coated substrates and other surfaces are presented, which illustrate the morphological features of these materials. Very high resolution images of sub micron surface features are produced which help in the basic understanding of complex problems in the printing process. AFM also allows imaging of the relative hardness and stickiness of the same specimen area which has been topographically mapped. Images of a variety of printed and coated substrates and other surfaces are presented, which illustrate the morphological features of these materials. Very high resolution images of sub micron surface features are produced which help in the basic understanding of complex problems in the printing process.