Modeling the Color of Multi-Colored Halftones

A mathematical model which provides the relationship between the dot areas of a combination of halftone patterns and the color produced by such multi-colored halftone patterns is disclosed. Such a model has application in calibration of digital color systems, digital picture exchange, and the simulation of spot color using process color techniques. The new model is an extension of the Spectral Yule-Nielsen model described by this author at a previous TAGA conference. It provides greater accuracy than the Neugebauer model, either with or without the Yule-Nielsen correction. The new model is an extension of the Spectral Yule-Nielsen model described by this author at a previous TAGA conference. It provides greater accuracy than the Neugebauer model, either with or without the Yule-Nielsen correction. Experimental verification of the Demichel dot overlap model is presented. The Demichel model was found to be accurate for halftone patterns superimposed at a 30 degree orientation. The new model provides an acceptable level of accuracy for many applications. In an experimental evaluation, many prediction of the new model were sufficiently close to measured color so as to be indistinguishable to a human observer.