Power Spectrum Analysis of Laser Generated Halftone Patterns

Details:

Year: 1992 Vol. 1
Pages: 15

Summary:

A technique to measure the halftone dot that relies on an analysis of the Fourier Transform, or optical power spectrum of a large nominally uniform array of halftone dots is discussed. The technique uses optical computing to enable an optical transfer function of the dot pattern without digital computation and then provides a quick mathematical analysis.